High spatial resolution X-ray spectra of Mg, Al, Si and P L-emission observed with a newly developed soft X-ray spectrometer for EPMA

T. Murano, H. Takahashi, N. Handa, M. Terauchi, M. Koike, T. Kawachi, I. Takashi, N. Hasegawa, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Original languageEnglish
Pages (from-to)776-777
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
Issue numberS2
DOIs
Publication statusPublished - 2012 Jul

ASJC Scopus subject areas

  • Instrumentation

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    Murano, T., Takahashi, H., Handa, N., Terauchi, M., Koike, M., Kawachi, T., Takashi, I., Hasegawa, N., Koeda, M., Nagano, T., Sasai, H., Oue, Y., Yonezawa, Z., & Kuramoto, S. (2012). High spatial resolution X-ray spectra of Mg, Al, Si and P L-emission observed with a newly developed soft X-ray spectrometer for EPMA. Microscopy and Microanalysis, 18(S2), 776-777. https://doi.org/10.1017/S1431927612005739