High spatial resolution X-ray spectra of Mg, Al, Si and P L-emission observed with a newly developed soft X-ray spectrometer for EPMA

T. Murano, H. Takahashi, N. Handa, M. Terauchi, M. Koike, T. Kawachi, I. Takashi, N. Hasegawa, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto

    Research output: Contribution to journalArticlepeer-review

    2 Citations (Scopus)

    Abstract

    Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

    Original languageEnglish
    Pages (from-to)776-777
    Number of pages2
    JournalMicroscopy and Microanalysis
    Volume18
    Issue numberS2
    DOIs
    Publication statusPublished - 2012 Jul

    ASJC Scopus subject areas

    • Instrumentation

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