High spatial resolution on-chip active magnetic field probe for IC chip-level near field measurements

Y. Shigeta, N. Sato, K. Arai, Masahiro Yamaguchi, S. Kageyama

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An on chip active magnetic field probe has been developed for IC chip-level magnetic near field measurements. A low noise amplifier (LNA) and a loop coil were implemented in 0.18 μm Si-CMOS technology, and solder-bonded to PCB to complete the probe. Its gain is 13.3 dB at 2 GHz. The probe is applied for magnetic near field evaluation of a test element group (TEG) chip that emulates Long Term Evolution (LTE)-class radio frequency integrated circuit (RFIC) receiver. It is demonstrated to detect on-chip in-band interference sources.

Original languageEnglish
Title of host publicationEMC 2014/Tokyo - 2014 International Symposium on Electromagnetic CompatibiIity, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages569-572
Number of pages4
ISBN (Electronic)9784885522871
Publication statusPublished - 2014 Dec 23
Event2014 International Symposium on Electromagnetic CompatibiIity, EMC 2014 - Tokyo, Japan
Duration: 2014 May 122014 May 16

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
Volume2014-December
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Other

Other2014 International Symposium on Electromagnetic CompatibiIity, EMC 2014
CountryJapan
CityTokyo
Period14/5/1214/5/16

Keywords

  • LTE-class receiver
  • low noise amplifier
  • magnetic field probe
  • magnetic near field measurement

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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