High sensitivity magnetic near field probe based on ferromagnetic thin-film technology

Masahiro Yamaguchi, Hiroaki Kikuchi, Satoshi Sugimoto, Ken Ichi Arai, Mizuki Iwanami, Atsushi Nakamura, Shigeki Hoshino

Research output: Contribution to conferencePaper

3 Citations (Scopus)

Abstract

The high frequency carrier type thin-film magnetic field sensor was applied to detect magnetic field over the micro strip line on a PCB. The 100μm long, 5μm wide and 1μm thick CoNbZr thin-film probe could distinguish a meander line of a line pitch of 200μm. Maximum possible signal frequency range was estimated as over 1GHz.

Original languageEnglish
Pages321-324
Number of pages4
Publication statusPublished - 2001 Dec 1
EventIEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging - Cambridge, MA, United States
Duration: 2001 Oct 292001 Oct 31

Other

OtherIEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging
CountryUnited States
CityCambridge, MA
Period01/10/2901/10/31

Keywords

  • Magnetic near field
  • Probe
  • Spatial resolution

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Dive into the research topics of 'High sensitivity magnetic near field probe based on ferromagnetic thin-film technology'. Together they form a unique fingerprint.

  • Cite this

    Yamaguchi, M., Kikuchi, H., Sugimoto, S., Arai, K. I., Iwanami, M., Nakamura, A., & Hoshino, S. (2001). High sensitivity magnetic near field probe based on ferromagnetic thin-film technology. 321-324. Paper presented at IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging, Cambridge, MA, United States.