High-sensitive X-ray imaging microscopes with transmission gratings

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X-ray microscopy is one of promising candidates to non-destructively visualize internal structures in samples under extreme environments. We have developed a high-sensitive X-ray imaging microscope consisting of an objective lens and a transmission grating. The microscope is based on the Talbot effect of the grating and works simply by appending the grating to an X-ray imaging microscope. Our approach has several advantages over the Zernike X-ray phase-contrast microscopy that has been widely used, and can provide a powerful way of quantitative visualization with a high spatial resolution and a high sensitivity even for relatively thick samples.

Original languageEnglish
Pages (from-to)227-236
Number of pages10
JournalReview of High Pressure Science and Technology/Koatsuryoku No Kagaku To Gijutsu
Issue number3
Publication statusPublished - 2013


  • Grating
  • Interferometry
  • Talbot effect
  • X-ray imaging
  • X-ray microscopy

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics


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