High-sensitive differential phase imaging has been performed with hard x-ray scanning transmission microscope optics and an imaging detector. A microbeam with the size of 160 nm at 8 keV x ray is generated by highly-coherent illuminated beam at x-ray undulator beamline BL20XU of SPring-8. The differential phase image is reconstructed by data set consists of diffraction images of each scan position. Advantages for absorption imaging are shown with some objects.
|Number of pages||4|
|Journal||Journal De Physique. IV : JP|
|Publication status||Published - 2003 Mar|
|Event||7th International Conference on X-Ray Microscopy - Grenoble, France|
Duration: 2002 Jul 28 → 2002 Aug 2
ASJC Scopus subject areas
- Physics and Astronomy(all)