Abstract
High-sensitive differential phase imaging has been performed with hard x-ray scanning transmission microscope optics and an imaging detector. A microbeam with the size of 160 nm at 8 keV x ray is generated by highly-coherent illuminated beam at x-ray undulator beamline BL20XU of SPring-8. The differential phase image is reconstructed by data set consists of diffraction images of each scan position. Advantages for absorption imaging are shown with some objects.
Original language | English |
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Pages (from-to) | 41-44 |
Number of pages | 4 |
Journal | Journal De Physique. IV : JP |
Volume | 104 |
DOIs | |
Publication status | Published - 2003 Mar |
Externally published | Yes |
Event | 7th International Conference on X-Ray Microscopy - Grenoble, France Duration: 2002 Jul 28 → 2002 Aug 2 |
ASJC Scopus subject areas
- Physics and Astronomy(all)