High-sensitive imaging with scanning transmission hard x-ray microscope

H. Takano, K. Uesugi, A. Takeuchi, K. Takai, Y. Suziki

Research output: Contribution to journalConference articlepeer-review

9 Citations (Scopus)


High-sensitive differential phase imaging has been performed with hard x-ray scanning transmission microscope optics and an imaging detector. A microbeam with the size of 160 nm at 8 keV x ray is generated by highly-coherent illuminated beam at x-ray undulator beamline BL20XU of SPring-8. The differential phase image is reconstructed by data set consists of diffraction images of each scan position. Advantages for absorption imaging are shown with some objects.

Original languageEnglish
Pages (from-to)41-44
Number of pages4
JournalJournal De Physique. IV : JP
Publication statusPublished - 2003 Mar
Externally publishedYes
Event7th International Conference on X-Ray Microscopy - Grenoble, France
Duration: 2002 Jul 282002 Aug 2

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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