High-resolution transmission electron microscopy observation of liquid-phase bonded aluminum/sapphire interfaces

Christine Marie Montesa, Naoya Shibata, Si Young Choi, Hiroshi Tonomura, Kazuhiro Akiyama, Yoshirou Kuromitsu, Yuichi Ikuhara

    Research output: Contribution to journalArticlepeer-review

    7 Citations (Scopus)

    Abstract

    In this paper, we characterized aluminum/sapphire interface structure by using high-resolution transmission electron microscopy. It was found that step structures of sapphire formed at the aluminum/sapphire interfaces during the liquid-phase bonding. It was discovered that the addition of silicon in aluminum significantly reduces the step growth at the interface. Silicon was found to segregate and precipitate at the interface. These results suggest that the strong preference of silicon at the interface may inhibit the step growth reactions during liquid-phase bonding.

    Original languageEnglish
    Pages (from-to)1037-1040
    Number of pages4
    JournalMaterials Transactions
    Volume50
    Issue number5
    DOIs
    Publication statusPublished - 2009 May

    Keywords

    • High resolution transmission electron microscopy
    • Liquid phase bonding
    • Metal/ceramic hetero interface
    • Segregation

    ASJC Scopus subject areas

    • Materials Science(all)
    • Condensed Matter Physics
    • Mechanics of Materials
    • Mechanical Engineering

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