TY - JOUR
T1 - High-resolution transmission electron microscopy observation of liquid-phase bonded aluminum/sapphire interfaces
AU - Montesa, Christine Marie
AU - Shibata, Naoya
AU - Choi, Si Young
AU - Tonomura, Hiroshi
AU - Akiyama, Kazuhiro
AU - Kuromitsu, Yoshirou
AU - Ikuhara, Yuichi
N1 - Copyright:
Copyright 2009 Elsevier B.V., All rights reserved.
PY - 2009/5
Y1 - 2009/5
N2 - In this paper, we characterized aluminum/sapphire interface structure by using high-resolution transmission electron microscopy. It was found that step structures of sapphire formed at the aluminum/sapphire interfaces during the liquid-phase bonding. It was discovered that the addition of silicon in aluminum significantly reduces the step growth at the interface. Silicon was found to segregate and precipitate at the interface. These results suggest that the strong preference of silicon at the interface may inhibit the step growth reactions during liquid-phase bonding.
AB - In this paper, we characterized aluminum/sapphire interface structure by using high-resolution transmission electron microscopy. It was found that step structures of sapphire formed at the aluminum/sapphire interfaces during the liquid-phase bonding. It was discovered that the addition of silicon in aluminum significantly reduces the step growth at the interface. Silicon was found to segregate and precipitate at the interface. These results suggest that the strong preference of silicon at the interface may inhibit the step growth reactions during liquid-phase bonding.
KW - High resolution transmission electron microscopy
KW - Liquid phase bonding
KW - Metal/ceramic hetero interface
KW - Segregation
UR - http://www.scopus.com/inward/record.url?scp=67650475905&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=67650475905&partnerID=8YFLogxK
U2 - 10.2320/matertrans.MC200810
DO - 10.2320/matertrans.MC200810
M3 - Article
AN - SCOPUS:67650475905
VL - 50
SP - 1037
EP - 1040
JO - Materials Transactions
JF - Materials Transactions
SN - 1345-9678
IS - 5
ER -