High-resolution transmission electron microscopy (HRTEM) observation of dislocation structures in A1N thin films

Yuki Tokumoto, Naoya Shibata, Teruyasu Mizoguchi, Masakazu Sugiyama, Yukihiro Shimogaki, Jung Seung Yang, Takahisa Yamamoto, Yuichi Ikuhara

    Research output: Contribution to journalArticle

    11 Citations (Scopus)

    Abstract

    The structure and configuration of threading dislocations (TDs) in AIN films grown on (0001) sapphire by metal-organic vapor phase epitaxy (MOVPE) were characterized by high-resolution transmission electron microscopy (HRTEM). It was found that the TDs formed in the films were mainly the perfect edge dislocations with the Burgers vector of b = 1/ 3(1120). The majority of the edge TDs were not randomly formed but densely arranged in lines. The arrays of the edge TDs were mainly observed on the {1120} and {1010} planes. These two planes showed different configurations of TDs. TD arrays on both of these planes constituted low-angle boundaries. We suggest that these TDs are introduced to compensate for slight misorientations between the subgrains during the film growth.

    Original languageEnglish
    Pages (from-to)2188-2194
    Number of pages7
    JournalJournal of Materials Research
    Volume23
    Issue number8
    DOIs
    Publication statusPublished - 2008 Aug 1

    ASJC Scopus subject areas

    • Materials Science(all)
    • Condensed Matter Physics
    • Mechanics of Materials
    • Mechanical Engineering

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  • Cite this

    Tokumoto, Y., Shibata, N., Mizoguchi, T., Sugiyama, M., Shimogaki, Y., Yang, J. S., Yamamoto, T., & Ikuhara, Y. (2008). High-resolution transmission electron microscopy (HRTEM) observation of dislocation structures in A1N thin films. Journal of Materials Research, 23(8), 2188-2194. https://doi.org/10.1557/jmr.2008.0265