High-Resolution TEM Observations of Superdislocations in Ni3(Al, Ti)

Takeshi Kawabata; Daisuke Shindo; Kenji Hiraga

doi:10.2320/matertrans1989.33.565

High-Resolution TEM Observations of Superdislocations in Ni₃(Al, Ti)

Takeshi Kawabata, Daisuke Shindo, Kenji Hiraga

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

End-on images of dislocations in Ni₃(Al, Ti) single crystals deformed at 683 and 293 K were observed by high-resolution transmission electron microscopy. They showed a superlattice intrinsic stacking fault (SISF) type of dissociation on a {111} plane and an antiphase boundary (APB) type of dissociation on a {001} plane. SISF and APB energies were calculated to be 133 and 560 mJ/m², respectively, using an isotropic elasticity theory, and they were compared with the other results obtained by field ion microscopy, weak-beam technique and high-resolution electron microscopy. It is considered that a decrease of dissociation distance due to the Ti addition results in an increase of strength anomaly.

Original language	English
Pages (from-to)	565-570
Number of pages	6
Journal	Materials Transactions, JIM
Volume	33
Issue number	6
DOIs	https://doi.org/10.2320/matertrans1989.33.565
Publication status	Published - 1992
Externally published	Yes

Keywords

Ni(Al,Ti)
antiphase boundary energy
dissociation distance
end-on image
high-resolution observation
intermetallic compound
single crystal
superdislocation
superlattice intrinsic stacking fault energy
transmission electron microscopy

ASJC Scopus subject areas

Engineering(all)

Access to Document

10.2320/matertrans1989.33.565

Cite this

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title = "High-Resolution TEM Observations of Superdislocations in Ni3(Al, Ti)",

abstract = "End-on images of dislocations in Ni3(Al, Ti) single crystals deformed at 683 and 293 K were observed by high-resolution transmission electron microscopy. They showed a superlattice intrinsic stacking fault (SISF) type of dissociation on a {111} plane and an antiphase boundary (APB) type of dissociation on a {001} plane. SISF and APB energies were calculated to be 133 and 560 mJ/m2, respectively, using an isotropic elasticity theory, and they were compared with the other results obtained by field ion microscopy, weak-beam technique and high-resolution electron microscopy. It is considered that a decrease of dissociation distance due to the Ti addition results in an increase of strength anomaly.",

keywords = "Ni(Al,Ti), antiphase boundary energy, dissociation distance, end-on image, high-resolution observation, intermetallic compound, single crystal, superdislocation, superlattice intrinsic stacking fault energy, transmission electron microscopy",

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language = "English",

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T1 - High-Resolution TEM Observations of Superdislocations in Ni3(Al, Ti)

AU - Kawabata, Takeshi

AU - Shindo, Daisuke

AU - Hiraga, Kenji

PY - 1992

Y1 - 1992

N2 - End-on images of dislocations in Ni3(Al, Ti) single crystals deformed at 683 and 293 K were observed by high-resolution transmission electron microscopy. They showed a superlattice intrinsic stacking fault (SISF) type of dissociation on a {111} plane and an antiphase boundary (APB) type of dissociation on a {001} plane. SISF and APB energies were calculated to be 133 and 560 mJ/m2, respectively, using an isotropic elasticity theory, and they were compared with the other results obtained by field ion microscopy, weak-beam technique and high-resolution electron microscopy. It is considered that a decrease of dissociation distance due to the Ti addition results in an increase of strength anomaly.

AB - End-on images of dislocations in Ni3(Al, Ti) single crystals deformed at 683 and 293 K were observed by high-resolution transmission electron microscopy. They showed a superlattice intrinsic stacking fault (SISF) type of dissociation on a {111} plane and an antiphase boundary (APB) type of dissociation on a {001} plane. SISF and APB energies were calculated to be 133 and 560 mJ/m2, respectively, using an isotropic elasticity theory, and they were compared with the other results obtained by field ion microscopy, weak-beam technique and high-resolution electron microscopy. It is considered that a decrease of dissociation distance due to the Ti addition results in an increase of strength anomaly.

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KW - antiphase boundary energy

KW - dissociation distance

KW - end-on image

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KW - superdislocation

KW - superlattice intrinsic stacking fault energy

KW - transmission electron microscopy

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