Abstract
End-on images of dislocations in Ni3(Al, Ti) single crystals deformed at 683 and 293 K were observed by high-resolution transmission electron microscopy. They showed a superlattice intrinsic stacking fault (SISF) type of dissociation on a {111} plane and an antiphase boundary (APB) type of dissociation on a {001} plane. SISF and APB energies were calculated to be 133 and 560 mJ/m2, respectively, using an isotropic elasticity theory, and they were compared with the other results obtained by field ion microscopy, weak-beam technique and high-resolution electron microscopy. It is considered that a decrease of dissociation distance due to the Ti addition results in an increase of strength anomaly.
| Original language | English |
|---|---|
| Pages (from-to) | 565-570 |
| Number of pages | 6 |
| Journal | Materials Transactions, JIM |
| Volume | 33 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 1992 Jan 1 |
Keywords
- Ni(Al,Ti)
- antiphase boundary energy
- dissociation distance
- end-on image
- high-resolution observation
- intermetallic compound
- single crystal
- superdislocation
- superlattice intrinsic stacking fault energy
- transmission electron microscopy
ASJC Scopus subject areas
- Engineering(all)
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Kawabata, T., Shindo, D., & Hiraga, K. (1992). High-Resolution TEM Observations of Superdislocations in Ni3(Al, Ti). Materials Transactions, JIM, 33(6), 565-570. https://doi.org/10.2320/matertrans1989.33.565