High-Resolution TEM Observations of Superdislocations in Ni3(Al, Ti)

Takeshi Kawabata, Daisuke Shindo, Kenji Hiraga

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

End-on images of dislocations in Ni3(Al, Ti) single crystals deformed at 683 and 293 K were observed by high-resolution transmission electron microscopy. They showed a superlattice intrinsic stacking fault (SISF) type of dissociation on a {111} plane and an antiphase boundary (APB) type of dissociation on a {001} plane. SISF and APB energies were calculated to be 133 and 560 mJ/m2, respectively, using an isotropic elasticity theory, and they were compared with the other results obtained by field ion microscopy, weak-beam technique and high-resolution electron microscopy. It is considered that a decrease of dissociation distance due to the Ti addition results in an increase of strength anomaly.

Original languageEnglish
Pages (from-to)565-570
Number of pages6
JournalMaterials Transactions, JIM
Volume33
Issue number6
DOIs
Publication statusPublished - 1992 Jan 1

Keywords

  • Ni(Al,Ti)
  • antiphase boundary energy
  • dissociation distance
  • end-on image
  • high-resolution observation
  • intermetallic compound
  • single crystal
  • superdislocation
  • superlattice intrinsic stacking fault energy
  • transmission electron microscopy

ASJC Scopus subject areas

  • Engineering(all)

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