High-Resolution TEM Observations of Superdislocations in Ni3(Al, Ti)

Takeshi Kawabata, Daisuke Shindo, Kenji Hiraga

    Research output: Contribution to journalArticlepeer-review

    11 Citations (Scopus)


    End-on images of dislocations in Ni3(Al, Ti) single crystals deformed at 683 and 293 K were observed by high-resolution transmission electron microscopy. They showed a superlattice intrinsic stacking fault (SISF) type of dissociation on a {111} plane and an antiphase boundary (APB) type of dissociation on a {001} plane. SISF and APB energies were calculated to be 133 and 560 mJ/m2, respectively, using an isotropic elasticity theory, and they were compared with the other results obtained by field ion microscopy, weak-beam technique and high-resolution electron microscopy. It is considered that a decrease of dissociation distance due to the Ti addition results in an increase of strength anomaly.

    Original languageEnglish
    Pages (from-to)565-570
    Number of pages6
    JournalMaterials Transactions, JIM
    Issue number6
    Publication statusPublished - 1992 Jan 1


    • Ni(Al,Ti)
    • antiphase boundary energy
    • dissociation distance
    • end-on image
    • high-resolution observation
    • intermetallic compound
    • single crystal
    • superdislocation
    • superlattice intrinsic stacking fault energy
    • transmission electron microscopy

    ASJC Scopus subject areas

    • Engineering(all)


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