High-resolution PIXE with crystal spectrometer and position-sensitive proportional counter

K. Ishii, H. Hamanaka, S. Morita, M. Ohura, Y. Yamamoto, Y. Awaya

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

A crystal spectrometer combined with a position-sensitive proportional counter was developed for analysing particle-induced X-rays. Three satellite lines (KL0, KL1, and KL2) of Si Kα X-rays produced by 1.5 MeV H+ ion bombardment were well resolved. Energy resolutions of 3 and 30 eV are obtained, respectively, for Si K X-rays (1.74 keV) and Cr Kα1 X-rays (5.414 keV). This method is expected to give a high-resolution PIXE of reasonable efficiency with low background or high detection limit, especially, for analysing light-element impurities in heavy-element matrix, and also to be useful for studies of ion-atom collisions, such as bremsstrahlung production and chemical effects in ion-atom collisions.

Original languageEnglish
Pages (from-to)97-100
Number of pages4
JournalVacuum
Volume39
Issue number2-4
DOIs
Publication statusPublished - 1989

ASJC Scopus subject areas

  • Instrumentation
  • Condensed Matter Physics
  • Surfaces, Coatings and Films

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