High-resolution multislice X-ray ptychography of extended thick objects

Akihiro Suzuki, Shin Furutaku, Kei Shimomura, Kazuto Yamauchi, Yoshiki Kohmura, Tetsuya Ishikawa, Yukio Takahashi

Research output: Contribution to journalArticlepeer-review

64 Citations (Scopus)

Abstract

We report the first demonstration of hard x-ray ptychography using a multislice approach, which can solve the problem of the limited spatial resolution under the projection approximation. We measured ptychographic diffraction patterns of a two-layered object with a 105 μm gap using 7 keV focused coherent x rays. We successfully reconstructed the phase map of each layer at ∼50 nm resolution using a multislice approach, while the resolution was worse than ∼192 nm under the projection approximation. The present method has the potential to enable the three-dimensional high-resolution observation of extended thick specimens in materials science and biology.

Original languageEnglish
Article number053903
JournalPhysical review letters
Volume112
Issue number5
DOIs
Publication statusPublished - 2014 Feb 4
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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