High resolution microscopy study in Cr3C2-doped WC-Co

T. Yamamoto, Y. Ikuhara, T. Watanabe, T. Sakuma, Y. Taniuchi, K. Okada, T. Tanase

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    Abstract

    Microstructure in Cr3C2-doped WC-Co was examined by high-resolution electron microscopy (HRTEM) and X-ray energy dispersive spectroscopy (EDS) with a special interest in the segregation of Cr at WC/Co interfaces and WC/WC grain boundaries. The macroscopic morphology of carbide grains in Cr3C2-doped WC-Co was almost the same as that of non-doped one, however, doping of a small amount of Cr3O2 on WC-Co was found to be effective to reduce the grain size of carbide grains. HRTEM study revealed that both WC/Co and WC/WC interfaces were free from secondary phases or amorphous films. Nano-probe EDS analysis revealed that Cr segregated at both WC/Co and WC/WC interfaces in the Cr3O2 doped WC-Co. The grain growth retardation of carbide grains observed in the Cr3C2-doped WC-Co must be closely related to the segregation of Cr. On the other hand, an asymmetric tilt ∑2 grain boundary of WC/WC was observed in the grain orientation of (0001)//(112̄0), [12̄10]//[1̄101]. The formation of this coherent boundary results from a small misfit of about 2% in a/c-axis of WC hexagonal lattice structure. The segregation of Cr and Co was detected also at this boundary in spite of high coherent boundary. This would be due to a small distortion of the grain boundary from an ideal ∑2 boundary.

    Original languageEnglish
    Pages (from-to)3885-3890
    Number of pages6
    JournalJournal of Materials Science
    Volume36
    Issue number16
    DOIs
    Publication statusPublished - 2001 Aug 15

    ASJC Scopus subject areas

    • Materials Science(all)
    • Mechanics of Materials
    • Mechanical Engineering

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