High-resolution measurement of Beutler-Fano profiles for autoionizing Rydberg series of Xe

Kengo Maeda, Kiyoshi Ueda, Takeshi Namioka, Kenji Ito

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)

Abstract

Photoabsorption cross sections for the ns and nd autoionizing Rydberg series of Xe have been measured with a resolution of 7.4 m using a high-resolution spectrometer and synchrotron radiation. The cross sections are parametrized with the aid of a line-shape formula that is based on the multichannel-quantum-defect theory and has a form analogous to Fanos resonance formula and are compared in detail with theoretical predictions available in the literature.

Original languageEnglish
Pages (from-to)527-530
Number of pages4
JournalPhysical Review A
Volume45
Issue number1
DOIs
Publication statusPublished - 1992

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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