High-resolution in-situ transmission electron microscopy observation of a solid-liquid interface in the Al-Si system

S. Arai, S. Tsukimoto, H. Miyai, H. Saka

Research output: Contribution to journalArticlepeer-review

23 Citations (Scopus)

Abstract

A solid-liquid interface in the-Al-Si system has been observed at near-atomic resolution by in-situ heating experiments inside transmission electron microscopes. The solid Si/alloy liquid of Al(-Si) interface shows facetting on {111} planes of Si and is very straight on the atomic scale even while it moves during solidification. There exists a transition layer between solid Si and liquid Al(-Si).

Original languageEnglish
Pages (from-to)317-321
Number of pages5
JournalJournal of Electron Microscopy
Volume48
Issue number4
DOIs
Publication statusPublished - 1999
Externally publishedYes

Keywords

  • Al-Si alloy
  • HREM in-situ electron microscopy
  • Solid-liquid interface

ASJC Scopus subject areas

  • Instrumentation

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