High-resolution in-situ transmission electron microscopy observation of a solid-liquid interface in the Al-Si system

S. Arai, S. Tsukimoto, H. Miyai, H. Saka

    Research output: Contribution to journalArticlepeer-review

    23 Citations (Scopus)

    Abstract

    A solid-liquid interface in the-Al-Si system has been observed at near-atomic resolution by in-situ heating experiments inside transmission electron microscopes. The solid Si/alloy liquid of Al(-Si) interface shows facetting on {111} planes of Si and is very straight on the atomic scale even while it moves during solidification. There exists a transition layer between solid Si and liquid Al(-Si).

    Original languageEnglish
    Pages (from-to)317-321
    Number of pages5
    JournalJournal of Electron Microscopy
    Volume48
    Issue number4
    DOIs
    Publication statusPublished - 1999

    Keywords

    • Al-Si alloy
    • HREM in-situ electron microscopy
    • Solid-liquid interface

    ASJC Scopus subject areas

    • Instrumentation

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