High Resolution Imaging Techniques for Understanding of Mesoscopic Phenomena

Yasukazu Murakami

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Transmission electron microscopy (TEM) is a particularly useful tool for studies of mesoscopic phenomena in multifunctional materials. Widely used in experiments in physics, chemistry, biology and materials science, TEM provides various methods for achieving real-space imaging of structures over a wide range of length scales, from atomic columns to macroscopic domain structures. In addition, using the interference of electron waves enables us to carry out high-resolution magnetic imaging, such as direct observation of magnetic flux lines in a thin-foil specimen and determination of important magnetic parameters (e.g., magnetocrystalline anisotropy constant) from a nanometer-scale area. In this chapter, we explain the essence of several methods related to electron microscopy, including energy-filtered electron diffraction, high-resolution TEM (methods for lattice imaging), the classical dark-field method, Lorentz microscopy, and electron holography. These methods provide essential information for a deeper understanding of mesoscopic structures produced in crystalline solids, and the mechanisms underlying material functionalities induced by the mesoscopic phenomena.

Original languageEnglish
Title of host publicationMesoscopic Phenomena in Multifunctional Materials
Subtitle of host publicationSynthesis, Characterizatio, Modeling and Applications
PublisherSpringer-Verlag
Pages109-135
Number of pages27
ISBN (Print)9783642553745
DOIs
Publication statusPublished - 2014 Jan 1

Publication series

NameSpringer Series in Materials Science
Volume198
ISSN (Print)0933-033X

ASJC Scopus subject areas

  • Materials Science(all)

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