High resolution imaging by 1 MV electron microscopy

M. Hirabayashi, K. Hiraga, D. Shindo

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)

Abstract

High voltage electron microscopy is well suited to the high resolution imaging of local structural changes in a material. New information at atomic resolution can be obtained on a broad range of material problems. Investigations of the structure of dislocations and planar faults in metallic and covalent crystals is presented.

Original languageEnglish
Pages (from-to)197-202
Number of pages6
JournalUltramicroscopy
Volume9
Issue number3
DOIs
Publication statusPublished - 1982

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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