High resolution imaging by 1 MV electron microscopy

M. Hirabayashi, K. Hiraga, D. Shindo

    Research output: Contribution to journalArticlepeer-review

    17 Citations (Scopus)

    Abstract

    High voltage electron microscopy is well suited to the high resolution imaging of local structural changes in a material. New information at atomic resolution can be obtained on a broad range of material problems. Investigations of the structure of dislocations and planar faults in metallic and covalent crystals is presented.

    Original languageEnglish
    Pages (from-to)197-202
    Number of pages6
    JournalUltramicroscopy
    Volume9
    Issue number3
    DOIs
    Publication statusPublished - 1982

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics
    • Instrumentation

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