Abstract
High voltage electron microscopy is well suited to the high resolution imaging of local structural changes in a material. New information at atomic resolution can be obtained on a broad range of material problems. Investigations of the structure of dislocations and planar faults in metallic and covalent crystals is presented.
Original language | English |
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Pages (from-to) | 197-202 |
Number of pages | 6 |
Journal | Ultramicroscopy |
Volume | 9 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1982 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation