High resolution imaging by 1 MV electron microscopy

M. Hirabayashi; K. Hiraga; D. Shindo

doi:10.1016/0304-3991(82)90200-5

High resolution imaging by 1 MV electron microscopy

M. Hirabayashi, K. Hiraga, D. Shindo

Research output: Contribution to journal › Article › peer-review

17 Citations (Scopus)

Abstract

High voltage electron microscopy is well suited to the high resolution imaging of local structural changes in a material. New information at atomic resolution can be obtained on a broad range of material problems. Investigations of the structure of dislocations and planar faults in metallic and covalent crystals is presented.

Original language	English
Pages (from-to)	197-202
Number of pages	6
Journal	Ultramicroscopy
Volume	9
Issue number	3
DOIs	https://doi.org/10.1016/0304-3991(82)90200-5
Publication status	Published - 1982

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/0304-3991(82)90200-5

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title = "High resolution imaging by 1 MV electron microscopy",

abstract = "High voltage electron microscopy is well suited to the high resolution imaging of local structural changes in a material. New information at atomic resolution can be obtained on a broad range of material problems. Investigations of the structure of dislocations and planar faults in metallic and covalent crystals is presented.",

author = "M. Hirabayashi and K. Hiraga and D. Shindo",

year = "1982",

doi = "10.1016/0304-3991(82)90200-5",

language = "English",

volume = "9",

pages = "197--202",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

number = "3",

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TY - JOUR

T1 - High resolution imaging by 1 MV electron microscopy

AU - Hirabayashi, M.

AU - Hiraga, K.

AU - Shindo, D.

PY - 1982

Y1 - 1982

N2 - High voltage electron microscopy is well suited to the high resolution imaging of local structural changes in a material. New information at atomic resolution can be obtained on a broad range of material problems. Investigations of the structure of dislocations and planar faults in metallic and covalent crystals is presented.

AB - High voltage electron microscopy is well suited to the high resolution imaging of local structural changes in a material. New information at atomic resolution can be obtained on a broad range of material problems. Investigations of the structure of dislocations and planar faults in metallic and covalent crystals is presented.

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U2 - 10.1016/0304-3991(82)90200-5

DO - 10.1016/0304-3991(82)90200-5

M3 - Article

AN - SCOPUS:0020460701

VL - 9

SP - 197

EP - 202

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 3

ER -

High resolution imaging by 1 MV electron microscopy

Abstract

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