High-resolution image simulation of overlap structures in TiAl alloy

C. L. Chen, W. Lu, Y. Y. Cui, L. L. He, H. Q. Ye

    Research output: Contribution to journalArticlepeer-review

    11 Citations (Scopus)


    High-resolution electron microscopy (HREM) images of the overlap structures in TiAl have been studied by the comparisons of experimental techniques and theoretic simulations. Several misunderstandings about TiAl microstructures were corrected. First, studies revealed that the reported 9R structures in TiAl must result from the overlap of two twin-related γ laths. They were not the true 9R structure. Second, the fringes (FR) between the γ and α2 phases have once been misconsidered as the stacking faults fringes which promoted the α2 ↔ γ phase transformations. This work proved them to be the fringes caused by the overlap of the α2 and γ phases. Through study of the imaging of the overlap structures, a new formation mechanism of the fringes has been proposed.

    Original languageEnglish
    Pages (from-to)179-186
    Number of pages8
    JournalJournal of Alloys and Compounds
    Issue number1-2
    Publication statusPublished - 2009 Jan 22


    • Crystal structural and symmetry
    • Intermetallics
    • Scanning and transmission electron microscopy

    ASJC Scopus subject areas

    • Mechanics of Materials
    • Mechanical Engineering
    • Metals and Alloys
    • Materials Chemistry


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