TY - JOUR
T1 - High resolution hard X-ray photoemission using synchrotron radiation as an essential tool for characterization of thin solid films
AU - Kim, J. J.
AU - Ikenaga, E.
AU - Kobata, M.
AU - Takeuchi, A.
AU - Awaji, M.
AU - Makino, H.
AU - Chen, P. P.
AU - Yamamoto, A.
AU - Matsuoka, T.
AU - Miwa, D.
AU - Nishino, Y.
AU - Yamamoto, T.
AU - Yao, T.
AU - Kobayashi, K.
N1 - Funding Information:
We would like to thank Dr. J. Harries for the examination of this manuscript. This work was partially supported by the through a Grant-in-Aid for Scientific Research (A) (No. 32678) and also partially supported by a Nanotechnology Support Project of The Ministry of Education, Culture, Sports, Science and Technology.
PY - 2006/5/30
Y1 - 2006/5/30
N2 - Recently, we have shown that hard X-ray photoemission spectroscopy using undulator X-rays at SPring-8 is quite feasible with both high resolution and high throughput. Here we report an application of hard X-ray photoemission spectroscopy to the characterization of electronic and chemical states of thin solid films, for which conventional PES is not applicable. As a typical example, we focus on the problem of the scatter in the reported band-gap values for InN. We show that oxygen incorporation into the InN film strongly modifies the valence and plays a crucial role in the band gap problem. The present results demonstrate the powerful applicability of high resolution photoemission spectroscopy with hard X-rays from a synchrotron source.
AB - Recently, we have shown that hard X-ray photoemission spectroscopy using undulator X-rays at SPring-8 is quite feasible with both high resolution and high throughput. Here we report an application of hard X-ray photoemission spectroscopy to the characterization of electronic and chemical states of thin solid films, for which conventional PES is not applicable. As a typical example, we focus on the problem of the scatter in the reported band-gap values for InN. We show that oxygen incorporation into the InN film strongly modifies the valence and plays a crucial role in the band gap problem. The present results demonstrate the powerful applicability of high resolution photoemission spectroscopy with hard X-rays from a synchrotron source.
KW - High resolution hard X-ray photoemission spectroscopy
KW - InN
KW - Oxygen incorporation
UR - http://www.scopus.com/inward/record.url?scp=33746798078&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33746798078&partnerID=8YFLogxK
U2 - 10.1016/j.apsusc.2005.12.032
DO - 10.1016/j.apsusc.2005.12.032
M3 - Article
AN - SCOPUS:33746798078
VL - 252
SP - 5602
EP - 5606
JO - Applied Surface Science
JF - Applied Surface Science
SN - 0169-4332
IS - 15
ER -