Photoemission Spectroscopy (PES) is a powerful method to investigate electronic structure of materials. However, conventional vacuum ultraviolet (VUV) and soft x-ray (SX) PES is surface sensitive because of the short inelastic-mean-free-paths of photoelectrons. This requires us to prepare clean surface and sometimes obscures intrinsic bulk states. In order to realize bulk-sensitive or surface-insensitive PES, we have developed hard x-ray (HX) PES using high-brilliance synchrotron radiation at BL29XU in SPring-8. Large probing depth of high energy photoelectrons enables us to probe intrinsic bulk states almost free from surface condition. A combination of x-ray optics and an electron energy analyzer dedicated for HX-PES achieved the total instrumental energy resolution of 63 and 55 meV (FWHM) at 5.95 and 7.94 keV, respectively. A special arrangement of an analyzer and a sample was employed and increased photoelectron intensity drastically. We describe present performance of our apparatus and characterize HX-PES by showing typical spectra.