Abstract
An artificially formed Σ = 13(67.38°) [100] tilt boundary in an Ni3(Al0.6 Ti0.4) crystal was investigated with end-on view by high resolution transmission electron microscopy. The result indicates that the atomic arrangement at the boundary was symmetric without any appreciable lattice distortion around it, and multislice calculations based on the coincidence site lattice model interpreted well the observed TEM images. Brief discussions were given in comparison with other geometrical models of the grain boundary.
| Original language | English |
|---|---|
| Pages (from-to) | 1417-1421 |
| Number of pages | 5 |
| Journal | Acta Metallurgica Et Materialia |
| Volume | 38 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 1990 Jan 1 |
ASJC Scopus subject areas
- Engineering(all)
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Sasaki, G., Shindo, D., Hiraga, K., Hirabayashi, M., & Takasugi, T. (1990). High resolution electron microscopy of tilt boundary in Ni3 (Al0.6 Ti0.4) bicrystal. Acta Metallurgica Et Materialia, 38(8), 1417-1421. https://doi.org/10.1016/0956-7151(90)90110-3