High-resolution electron microscopy of microstructure of MnF2 subjected to shock compression at 4.4 GPa

Kunio Yubuta, Teruhisa Hongo, Toshiyuki Atou, Kazutaka G. Nakamura, Ken ichi Kondo, Masae Kikuchi

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

Microstructure of MnF2 subjected to by shock compression at 4.4 GPa was examined using transmission electron microscopy (TEM). Lamellar structure consisting of twin-related domains of rutile-structure and intergrowth of α- PbO2-type phase is observed in the electron diffraction pattern and TEM images. The crystallographic relationship between rutile and α- PbO2-type phases can be expressed as (over(1, ̄) 01)rutile ∥ (001)α -PbO2 and [111]rutile ∥ [110]α -PbO2.

Original languageEnglish
Pages (from-to)127-130
Number of pages4
JournalSolid State Communications
Volume143
Issue number3
DOIs
Publication statusPublished - 2007 Jul
Externally publishedYes

Keywords

  • A. Microstructure
  • B. Shock compression
  • C. Electron diffraction and high-resolution image
  • D. Phase transition

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

Fingerprint

Dive into the research topics of 'High-resolution electron microscopy of microstructure of MnF<sub>2</sub> subjected to shock compression at 4.4 GPa'. Together they form a unique fingerprint.

Cite this