High resolution electron microscopy observation of TiC coated cemented carbide

Tetsuya Suzuki, Masaru Yagi, Kunio Shibuki, Toshiyuki Suzuki, Yuichi Ikuhara

    Research output: Contribution to journalArticlepeer-review

    3 Citations (Scopus)

    Abstract

    Cemented carbide (WC-6%Co) inserts were coated with 3-4 μm TiC by chemical vapor deposition at 1200 °C. High resolution electron microscopic observation showed the presence of Co6W6C (n1-phase) around the interface WC-Co, on top of which a TiC film 50-100 nm in size was observed. There was no particular crystallographic orientation relationship between the n1-phase and TiC films. The presence of W atoms in the films was confirmed using EDX by focusing an electron beam of size approximately 5 nm. In addition, the Σ = 2 boundary, which was attributed to the identical c/a ratio of WC, was observed between WC-WC grains.

    Original languageEnglish
    Pages (from-to)268-275
    Number of pages8
    JournalSurface and Coatings Technology
    Volume79
    Issue number1-3
    DOIs
    Publication statusPublished - 1996 Feb

    Keywords

    • Cemented carbide
    • High resolution electron microscopy
    • Interface
    • TiC film
    • η-phase

    ASJC Scopus subject areas

    • Chemistry(all)
    • Condensed Matter Physics
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films
    • Materials Chemistry

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