High-resolution electron microscopy and X-ray diffraction study of intergrowth structures in α-and β-type YbAlB4 single crystals

Kunio Yubuta, Takao Mori, Shigeru Okada, Yurii Prots, Horst Borrmann, Yuri Grin, Toetsu Shishido

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

Structural features of layered boride YbAlB4 single crystals with YCrB4-type (α-type) and ThMoB4-type (β-type) phases derived from a hexagonal AlB2-type structure were investigated by electron diffraction, high-resolution electron microscopy and X-ray diffraction. X-ray diffraction experiments indicate the existence of some structural motifs. High-resolution images clearly show that the structural motifs build the intergrown lamellar structures in the matrix. The lamellar structures can be characterized by a coherent tiling of deformed Yb hexagons, which are a common structure unit in the α-and β-type structures. The characteristic intergrown nanostructure is similar to that observed in the β-type TmAlB4 polycrystalline sample.

Original languageEnglish
Pages (from-to)1054-1064
Number of pages11
JournalPhilosophical Magazine
Volume93
Issue number9
DOIs
Publication statusPublished - 2013 Mar 1

Keywords

  • electron diffraction
  • high-resolution electron microscopy
  • intergrowth
  • rare earth aluminoboride

ASJC Scopus subject areas

  • Condensed Matter Physics

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