High-resolution diffraction microscopy using the plane-wave field of a nearly diffraction limited focused x-ray beam

Yukio Takahashi, Yoshinori Nishino, Ryosuke Tsutsumi, Hideto Kubo, Hayato Furukawa, Hidekazu Mimura, Satoshi Matsuyama, Nobuyuki Zettsu, Eiichiro Matsubara, Tetsuya Ishikawa, Kazuto Yamauchi

Research output: Contribution to journalArticlepeer-review

54 Citations (Scopus)

Abstract

X-ray waves in the center of the beam waist of nearly diffraction limited focused x-ray beams can be considered to have amplitude and phase that are both almost uniform, i.e., they are x-ray plane waves. Here we report the results of an experimental demonstration of high-resolution diffraction microscopy using the x-ray plane wave of the synchrotron x-ray beam focused using Kirkpatrik-Baez mirrors. A silver nanocube with an edge length of ∼100 nm is illuminated with the x-ray beam focused to a ∼1μm spot at 12 keV. A high-contrast symmetric diffraction pattern of the nanocube is observed in the forward far field. An image of the nanocube is successfully reconstructed by an iterative phasing method and its half-period resolution is 3.0 nm. This method does not only dramatically improve the spatial resolution of x-ray microscopy but also is a key technology for realizing single-pulse diffractive imaging using x-ray free-electron lasers.

Original languageEnglish
Article number054103
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume80
Issue number5
DOIs
Publication statusPublished - 2009 Aug 5
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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