High resolution atomic force microscopic imaging of the Si(111)-(7 × 7) surface: Contribution of short-range force to the images

Toyoaki Eguchi, Y. Hasegawa

Research output: Contribution to journalArticlepeer-review

72 Citations (Scopus)

Abstract

An observation of rest-atom and second-layer atom resolved atomic force microscopy (AFM) images is presented. Using a small force setting and a small oscillation amplitude of the cantilever, detecting the force due to the single chemical covalent bond acting between the atoms on the probing tip and sample surfaces is achieved. The capability of AFM for taking highly resolved images comparable with scanning tunneling microscopy (STM) opens up the versatility of the technique for practical applications.

Original languageEnglish
Article number266105
Pages (from-to)266105/1-266105/4
JournalPhysical review letters
Volume89
Issue number26
Publication statusPublished - 2002 Dec 23

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'High resolution atomic force microscopic imaging of the Si(111)-(7 × 7) surface: Contribution of short-range force to the images'. Together they form a unique fingerprint.

Cite this