Abstract
An observation of rest-atom and second-layer atom resolved atomic force microscopy (AFM) images is presented. Using a small force setting and a small oscillation amplitude of the cantilever, detecting the force due to the single chemical covalent bond acting between the atoms on the probing tip and sample surfaces is achieved. The capability of AFM for taking highly resolved images comparable with scanning tunneling microscopy (STM) opens up the versatility of the technique for practical applications.
| Original language | English |
|---|---|
| Article number | 266105 |
| Pages (from-to) | 266105/1-266105/4 |
| Journal | Physical review letters |
| Volume | 89 |
| Issue number | 26 |
| Publication status | Published - 2002 Dec 23 |
ASJC Scopus subject areas
- Physics and Astronomy(all)