High Resolution Atomic Force Microscopic Imaging of the [Formula presented] Surface: Contribution of Short-Range Force to the Images

Toyoaki Eguchi, Y. Hasegawa

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

Observation of the rest-atom layer of the [Formula presented] surface is performed by atomic force microscopy. By detecting the force due to the single chemical covalent bond formed between the tip and the sample surface, individual atoms on the layer were clearly resolved. Unprecedented high spatial resolution was achieved by setting the detection force at a small value and by reducing background forces due to the long-range interactions with the small oscillation amplitude of the cantilever and sharp probe tip.

Original languageEnglish
JournalPhysical Review Letters
Volume89
Issue number26
DOIs
Publication statusPublished - 2002 Jan 1
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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