High Reliability of Nanometer-Range N2O-Nitrided Oxides Due to Suppressing Hole Injection

K. Kobayashi, A. Teramoto, T. Nakamura, H. Watanabe, H. Kurokawa, Y. Matsui, M. Hirayama

Research output: Contribution to journal › Conference article › peer-review

9 Citations (Scopus)

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