High pressure x-ray diffraction study of URu2Si2

K. Kuwahara, H. Sagayama, K. Iwasa, M. Kohgi, S. Miyazaki, J. Nozaki, J. Nogami, M. Yokoyama, H. Amitsuka, H. Nakao, Y. Murakami

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7 Citations (Scopus)


We have performed high pressure X-ray diffraction measurements on a powder sample of the tetragonal heavy-electron compound URu2Si2 at low temperatures and pressure up to 3 GPa, in order to investigate a pressure-induced phase transition at Pc = ∼ 1.5 GPa, which was indicated in the neutron diffraction experiment under pressure. The pressure variations of the lattice parameters a and c at 15 K decrease monotonously with increasing pressure. No discontinuity of the lattice parameters of URu2Si2 around Pc is observed within experimental error.

Original languageEnglish
Pages (from-to)4307-4310
Number of pages4
JournalActa Physica Polonica B
Issue number8
Publication statusPublished - 2003 Aug
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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