High Precision Measurement of Twist Elastic Constant K22 of Liquid Crystal Materials using Ellipsometry Analysis

Takahiro Ishinabe, Yuzuka Morita, Yuji Ohno, Tetsuya Miyashita, Hideo Fujikake, Tatsuo Uchida

Research output: Contribution to journalArticle

Abstract

We proposed a simple and accurate method for measuring the twist elastic constant K22 of liquidcrystal materials. The novel technique is based on the ellipsometry analysis, and determines the director profile of a twisted nematic liquid crystal cell in the on state. We validated this experimentally, and showed that it is effective for evaluating the response characteristics of liquid crystal displays.

Original languageEnglish
Pages (from-to)52-59
Number of pages8
JournalITE Transactions on Media Technology and Applications
Volume2
Issue number1
DOIs
Publication statusPublished - 2014 Jan 1

Keywords

  • Director profile simulation
  • Elastic constant measurement
  • Ellipsometry analysis
  • K22
  • Liquid crystal
  • Twisted nematic

ASJC Scopus subject areas

  • Signal Processing
  • Media Technology
  • Computer Graphics and Computer-Aided Design

Fingerprint Dive into the research topics of 'High Precision Measurement of Twist Elastic Constant K22 of Liquid Crystal Materials using Ellipsometry Analysis'. Together they form a unique fingerprint.

  • Cite this