High precision measurement of twist elastic constant K22 of LC materials based on new ellipsometry analysis

Takahiro Ishinabe; Yuzuka Morita; Yuji Ohno; Tetsuya Miyashita; Tatsuo Uchida

High precision measurement of twist elastic constant K22 of LC materials based on new ellipsometry analysis

Takahiro Ishinabe, Yuzuka Morita, Yuji Ohno, Tetsuya Miyashita, Tatsuo Uchida

ENG - Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

A simple and accurate new method for measuring the twist elastic constant K22 of liquid-crystal (LC) materials was devised. We proposed a novel technique, based on ellipsometry analysis, to determine the director profile of a twisted nematic LC cell in the on state, and successfully obtained the value of K22 with a high degree of accuracy. We validated this procedure experimentally, and showed that it is effective for evaluating the response characteristics of LCDs.

Original language	English
Title of host publication	Society for Information Display - 18th International Display Workshops 2011, IDW'11
Pages	1557-1560
Number of pages	4
Publication status	Published - 2011
Event	18th International Display Workshops 2011, IDW 2011 - Nagoya, Japan Duration: 2011 Dec 7 → 2011 Dec 9

Publication series

Name	Proceedings of the International Display Workshops
Volume	3
ISSN (Print)	1883-2490

Other

Other	18th International Display Workshops 2011, IDW 2011
Country/Territory	Japan
City	Nagoya
Period	11/12/7 → 11/12/9

ASJC Scopus subject areas

Computer Vision and Pattern Recognition
Human-Computer Interaction
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Radiology Nuclear Medicine and imaging

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Cite this

High precision measurement of twist elastic constant K22 of LC materials based on new ellipsometry analysis. / Ishinabe, Takahiro; Morita, Yuzuka; Ohno, Yuji; Miyashita, Tetsuya; Uchida, Tatsuo.

Society for Information Display - 18th International Display Workshops 2011, IDW'11. 2011. p. 1557-1560 (Proceedings of the International Display Workshops; Vol. 3).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ishinabe, T, Morita, Y, Ohno, Y, Miyashita, T & Uchida, T 2011, High precision measurement of twist elastic constant K22 of LC materials based on new ellipsometry analysis. in Society for Information Display - 18th International Display Workshops 2011, IDW'11. Proceedings of the International Display Workshops, vol. 3, pp. 1557-1560, 18th International Display Workshops 2011, IDW 2011, Nagoya, Japan, 11/12/7.

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author = "Takahiro Ishinabe and Yuzuka Morita and Yuji Ohno and Tetsuya Miyashita and Tatsuo Uchida",

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AU - Ohno, Yuji

AU - Miyashita, Tetsuya

AU - Uchida, Tatsuo

PY - 2011

Y1 - 2011

N2 - A simple and accurate new method for measuring the twist elastic constant K22 of liquid-crystal (LC) materials was devised. We proposed a novel technique, based on ellipsometry analysis, to determine the director profile of a twisted nematic LC cell in the on state, and successfully obtained the value of K22 with a high degree of accuracy. We validated this procedure experimentally, and showed that it is effective for evaluating the response characteristics of LCDs.

AB - A simple and accurate new method for measuring the twist elastic constant K22 of liquid-crystal (LC) materials was devised. We proposed a novel technique, based on ellipsometry analysis, to determine the director profile of a twisted nematic LC cell in the on state, and successfully obtained the value of K22 with a high degree of accuracy. We validated this procedure experimentally, and showed that it is effective for evaluating the response characteristics of LCDs.

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M3 - Conference contribution

AN - SCOPUS:84870722411

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T3 - Proceedings of the International Display Workshops

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BT - Society for Information Display - 18th International Display Workshops 2011, IDW'11

T2 - 18th International Display Workshops 2011, IDW 2011

Y2 - 7 December 2011 through 9 December 2011

ER -

High precision measurement of twist elastic constant K22 of LC materials based on new ellipsometry analysis

Abstract

Publication series

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ASJC Scopus subject areas

UN SDGs

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