High precision measurement of twist elastic constant K22 of LC materials based on new ellipsometry analysis

Takahiro Ishinabe, Yuzuka Morita, Yuji Ohno, Tetsuya Miyashita, Tatsuo Uchida

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A simple and accurate new method for measuring the twist elastic constant K22 of liquid-crystal (LC) materials was devised. We proposed a novel technique, based on ellipsometry analysis, to determine the director profile of a twisted nematic LC cell in the on state, and successfully obtained the value of K22 with a high degree of accuracy. We validated this procedure experimentally, and showed that it is effective for evaluating the response characteristics of LCDs.

Original languageEnglish
Title of host publicationSociety for Information Display - 18th International Display Workshops 2011, IDW'11
Pages1557-1560
Number of pages4
Publication statusPublished - 2011
Event18th International Display Workshops 2011, IDW 2011 - Nagoya, Japan
Duration: 2011 Dec 72011 Dec 9

Publication series

NameProceedings of the International Display Workshops
Volume3
ISSN (Print)1883-2490

Other

Other18th International Display Workshops 2011, IDW 2011
Country/TerritoryJapan
CityNagoya
Period11/12/711/12/9

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Human-Computer Interaction
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Radiology Nuclear Medicine and imaging

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