TY - GEN
T1 - High precision measurement of twist elastic constant K22 of LC materials based on new ellipsometry analysis
AU - Ishinabe, Takahiro
AU - Morita, Yuzuka
AU - Ohno, Yuji
AU - Miyashita, Tetsuya
AU - Uchida, Tatsuo
N1 - Copyright:
Copyright 2012 Elsevier B.V., All rights reserved.
PY - 2011
Y1 - 2011
N2 - A simple and accurate new method for measuring the twist elastic constant K22 of liquid-crystal (LC) materials was devised. We proposed a novel technique, based on ellipsometry analysis, to determine the director profile of a twisted nematic LC cell in the on state, and successfully obtained the value of K22 with a high degree of accuracy. We validated this procedure experimentally, and showed that it is effective for evaluating the response characteristics of LCDs.
AB - A simple and accurate new method for measuring the twist elastic constant K22 of liquid-crystal (LC) materials was devised. We proposed a novel technique, based on ellipsometry analysis, to determine the director profile of a twisted nematic LC cell in the on state, and successfully obtained the value of K22 with a high degree of accuracy. We validated this procedure experimentally, and showed that it is effective for evaluating the response characteristics of LCDs.
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M3 - Conference contribution
AN - SCOPUS:84870722411
SN - 9781622761906
T3 - Proceedings of the International Display Workshops
SP - 1557
EP - 1560
BT - Society for Information Display - 18th International Display Workshops 2011, IDW'11
T2 - 18th International Display Workshops 2011, IDW 2011
Y2 - 7 December 2011 through 9 December 2011
ER -