High-precision measurement of polar anchoring strength and capacitance of alignment layers

Ryo Ogawa, Yuji Ohno, Takahiro Ishinabe, Tetsuya Miyashita, Tatsuo Uchida

Research output: Contribution to conferencePaper

3 Citations (Scopus)

Abstract

We devised a high precision measurement method for the polar anchoring strength and capacitance of alignment layers using homogeneous aligned Liquid Crystal (LC) cell. The polar anchoring strength is obtained by using numerical fitting between the theoretical values and measured value of the angular dependency of the amplitude ratio ψ and the phase difference ratio Δ. We confirmed the validly of this method from the measurement of several LC cells with different gaps.

Original languageEnglish
Pages1705-1706
Number of pages2
Publication statusPublished - 2007 Dec 1
Event14th International Display Workshops, IDW '07 - Sapporo, Japan
Duration: 2007 Dec 52007 Dec 5

Other

Other14th International Display Workshops, IDW '07
CountryJapan
CitySapporo
Period07/12/507/12/5

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Radiology Nuclear Medicine and imaging
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Ogawa, R., Ohno, Y., Ishinabe, T., Miyashita, T., & Uchida, T. (2007). High-precision measurement of polar anchoring strength and capacitance of alignment layers. 1705-1706. Paper presented at 14th International Display Workshops, IDW '07, Sapporo, Japan.