High precision measurement method for threshold voltage, elastic and dielectric constants ratio of liquid crystal materials

Yusuke Chiba, Yuji Ohno, Takahiro Ishinabe, Tetsuya Miyashita, Tatsuo Uchida

Research output: Contribution to conferencePaperpeer-review

Abstract

We have deviseda high-precision method of measuring the threshold voltage and the elastic and dielectric constants ratios of liquid crystal (LC) materials. We obtained these parameters from measuring the alignment distribution in the on state. We confirmed the validly of this method through measurements of several LC cells with different saps.

Original languageEnglish
Pages85-88
Number of pages4
Publication statusPublished - 2009 Dec 1
Event16th International Display Workshops, IDW '09 - Miyazaki, Japan
Duration: 2009 Dec 92009 Dec 11

Other

Other16th International Display Workshops, IDW '09
CountryJapan
CityMiyazaki
Period09/12/909/12/11

ASJC Scopus subject areas

  • Hardware and Architecture
  • Human-Computer Interaction
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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