Abstract
We have deviseda high-precision method of measuring the threshold voltage and the elastic and dielectric constants ratios of liquid crystal (LC) materials. We obtained these parameters from measuring the alignment distribution in the on state. We confirmed the validly of this method through measurements of several LC cells with different saps.
| Original language | English |
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| Pages | 85-88 |
| Number of pages | 4 |
| Publication status | Published - 2009 Dec 1 |
| Event | 16th International Display Workshops, IDW '09 - Miyazaki, Japan Duration: 2009 Dec 9 → 2009 Dec 11 |
Other
| Other | 16th International Display Workshops, IDW '09 |
|---|---|
| Country/Territory | Japan |
| City | Miyazaki |
| Period | 09/12/9 → 09/12/11 |
ASJC Scopus subject areas
- Hardware and Architecture
- Human-Computer Interaction
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials