High perpendicular magnetic anisotropy in D 022-Mn 3+xGe tetragonal Heusler alloy films

A. Sugihara, S. Mizukami, Y. Yamada, K. Koike, T. Miyazaki

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39 Citations (Scopus)


We prepared D022-Mn3+xGe (-0.67≤x≤0.35) epitaxial thin films on MgO(001) substrates with Cr(001) buffer layers and systematically investigated the dependence of their perpendicular magnetic anisotropy constant, saturation magnetization, coercivity, and tetragonal axial ratio (c/a) on their composition and substrate temperature. Single-phase D022 crystal structures were formed in films with compositions of 0≤x≤0.35, prepared at 400°C. The D0 22-Mn3Ge films exhibited perpendicular magnetization with a magnetic squareness close to unity. Performing magnetic torque measurements at an applied field of 140kOe, we estimated a perpendicular magnetic anisotropy constant of 11.8±0.5Merg/cm3, the highest and the most reliable value yet reported.

Original languageEnglish
Article number132404
JournalApplied Physics Letters
Issue number13
Publication statusPublished - 2014 Mar 31

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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