High-magnetic field x-ray diffraction studies on Gd5(Ge 2-xFex)Si2 (x = 0.05 and 0.2)

Jim Long Her, Keiichi Koyama, Kazuo Watanabe, Virgil Provenzano, Anqi Fu, Alexander J. Shapiro, Robert D. Shull

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8 Citations (Scopus)

Abstract

We performed the powder X-ray diffraction measurements in magnetic fields up to 5 T for Gd5(Ge1.95Fe0.05)Si2 and Gd5(Ge1.8Fe0.2)Si2. With heating from 8 K, the matrix of Gd5(Ge1.95Fe0.05) Si2 clearly shows a structural transition from an orthorhombic to a monoclinic structure at the Curie temperature (TC = 276 K). On the other hand, the matrix of Gd5(Ge1.8Fe0.2) Si2 with the orthorhombic structure in the ferromagnetic state shows two-phases co-existence of the orthorhombic and the monoclinic structures above TC = 303 K, indicating that a small amount of the matrix participates in the transformation. For both samples, the monoclinic structure is suppressed but the orthorhombic structure is enhanced just above TC by applying a magnetic field, which closely relates to the magnetization process.

Original languageEnglish
Pages (from-to)2011-2014
Number of pages4
JournalMaterials Transactions
Volume46
Issue number9
DOIs
Publication statusPublished - 2005 Sep 1

Keywords

  • Field-induced structural transformation
  • GdGeSi compound
  • High field X-ray diffraction
  • Magnetic refrigeration materials
  • Meta magnetic transition

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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    Her, J. L., Koyama, K., Watanabe, K., Provenzano, V., Fu, A., Shapiro, A. J., & Shull, R. D. (2005). High-magnetic field x-ray diffraction studies on Gd5(Ge 2-xFex)Si2 (x = 0.05 and 0.2). Materials Transactions, 46(9), 2011-2014. https://doi.org/10.2320/matertrans.46.2011