High frequency responses of YBa2Cu3O7-y Josephson junctions on Si substrates fabricated by focused electron beam irradiation

Sang Jae Kim, Hiroaki Myoren, Jian Chen, Kensuke Nakajima, Tsutomu Yamashita, Masayoshi Esashi

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1 Citation (Scopus)

Abstract

YBa2Cu3O7-y (YBCO) Josephson junctions on silicon (Si) substrates were fabricated by focused electron beam (FEB) irradiation. The junctions exhibit an operation temperature (T) dependence of current (I)-voltage (V) curves in the same manner as an SNS junction. As the temperature decreases, the junctions exhibit weak microwave-induced steps with flux flow-like I-V curves. At 25 K where the resistively shunted junction (RSJ)-like I-V curve appears, the junction exhibited the microwave-induced Shapiro steps up to 4 mV in dV/dI-V curves. This suggests that the junction can respond up to about 2 THz.

Original languageEnglish
Pages (from-to)L1096-L1099
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume36
Issue number8 SUPPL. B
DOIs
Publication statusPublished - 1997 Aug 15

Keywords

  • FEB irradiation
  • High frequency response
  • Josephson junction
  • Si
  • YBaCuO

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

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