High-frequency characterization of intrinsic FinFET channel

H. Sakai, S. O'Uchi, T. Matsukawa, K. Endo, Y. X. Liu, T. Tsukada, Y. Ishikawa, T. Nakagawa, T. Sekigawa, H. Koike, K. Sakamoto, M. Masahara, H. Ishikuro

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Fingerprint

Dive into the research topics of 'High-frequency characterization of intrinsic FinFET channel'. Together they form a unique fingerprint.