A method was developed for analyzing the feasibility of rapid x-ray scattering measurement for structure determination of nanowires in air. These crystalline nanowires were deposited on a crystal surfaces. When the x rays were incident perpendicular to the nanowires, the diffraction images pointed down at the direct beam position. The sheet-shape diffraction emanating from ultrathin NiO wires was observed using this method.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)