High-Energy X-ray Phase Tomography Using Grating Interferometer with Structured Anode X-ray Source

Kenji Kimura, Mengran Sun, Ryosuke Ueda, Yanlin Wu, Haogie Pan, Atsushi Momose

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

For high-energy X-ray phase tomography, an inverse Talbot-Lau interferometer using a structured-anode X-ray source has been constructed. The structured anode has a tungsten line-and-space pattern whose period is 3 μm. Thanks to the inverse geometry, a thick amplitude grating with a moderate aspect ratio is available for G2, resulting in a design energy of 82 keV. After confirming the operation of the source as expected, high-energy X-ray phase tomography was applied to a dry battery, which shows little transmission around 30 keV. Structural change in the negative electrode is depicted between tomograms reconstructed from scattering (dark-field) images of a fresh dry battery and identical fully-discharged one. From the viewpoint of practical application to nondestructive testing and medicine, exploring high-energy X-ray phase imaging is important. This result suggests that the use of the structured-anode X-ray source is effective for this purpose thus avoiding the challenge of developing extremely high-aspect-ratio gratings. If the period of the structured anode is reduced further, it will also be possible to remove G2.

Original languageEnglish
Title of host publicationDevelopments in X-Ray Tomography XIII
EditorsBert Muller, Ge Wang
PublisherSPIE
ISBN (Electronic)9781510645189
DOIs
Publication statusPublished - 2021
EventDevelopments in X-Ray Tomography XIII 2021 - San Diego, United States
Duration: 2021 Aug 12021 Aug 5

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11840
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceDevelopments in X-Ray Tomography XIII 2021
Country/TerritoryUnited States
CitySan Diego
Period21/8/121/8/5

Keywords

  • Grating
  • Interferometry
  • Non-destructive testing
  • Phase tomography
  • Structured-anode X-ray tube

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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