High density Cu-TSVs and reliability issues

Murugesan Mariappan, Harufumi Kobayashi, Takafumi Fukushima, Tetsu Tanaka, Mitsumasa Koyanagi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

Reliability issues such as thermo-mechanical stress, extrusion of via metal, and die-cracking caused by high density Cu-TSVs in 3D-LSI Si die/wafer after wafer thinning and bonding have been systematically investigated respectively using micro-Raman spectroscopy, laser microscopy, and optical microscopy techniques. It is inferred that (i) for the TSV pitch value of less than twice the TSV-width, the remnant stress present in the Si at the TSV space region is turned to be only compressive, i.e. in the lateral direction, the compressive stress produced by the adjacent TSVs overlapped to each other; for the TSV pitch values of greater than two times the TSV-width, the compressive stress in the Si at the vicinity of TSV is followed by the tensile stress and beyond that it becomes stress free at the TSV space region; (ii) Irrespective of the TSV shape and size, the lateral extrusion of Cu occurs at the TSV space region. The lateral extrusion becomes prominent for the larger TSV size values and the higher bonding temperatures. The lateral extrusion is larger for the 20 μm-width TSV annealed at the higher temperature (∼4 μm @ 400 °C) than for the TSV annealed at lower temperature (a maximum of only 1.5 μm @ 200 °C); (iii) Cracking of LSI die/wafer occurs at the periphery of the TSV array for very fine pitch values, and for larger pitch values cracking occurs in between TSVs.

Original languageEnglish
Title of host publication2011 IEEE International 3D Systems Integration Conference, 3DIC 2011
DOIs
Publication statusPublished - 2011 Dec 1
Event2011 IEEE International 3D Systems Integration Conference, 3DIC 2011 - Osaka, Japan
Duration: 2012 Jan 312012 Feb 2

Publication series

Name2011 IEEE International 3D Systems Integration Conference, 3DIC 2011

Other

Other2011 IEEE International 3D Systems Integration Conference, 3DIC 2011
CountryJapan
CityOsaka
Period12/1/3112/2/2

ASJC Scopus subject areas

  • Control and Systems Engineering

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    Mariappan, M., Kobayashi, H., Fukushima, T., Tanaka, T., & Koyanagi, M. (2011). High density Cu-TSVs and reliability issues. In 2011 IEEE International 3D Systems Integration Conference, 3DIC 2011 [6262969] (2011 IEEE International 3D Systems Integration Conference, 3DIC 2011). https://doi.org/10.1109/3DIC.2012.6262969