High-density carrier accumulation in ZnO field-effect transistors gated by electric double layers of ionic liquids

Hongtao Yuan, Hidekazu Shimotani, Atsushi Tsukazaki, Akira Ohtomo, Masashi Kawasaki, Yoshihiro Iwasa

Research output: Contribution to journalArticlepeer-review

421 Citations (Scopus)

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