High Contact Resistivity Enabling Low-Energy Operation in Cr2Ge2Te6-Based Phase-Change Random Access Memory

Shogo Hatayama, Yasunori Abe, Daisuke Ando, Yuji Sutou

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

A phase-change material (PCM) exhibiting a significant difference in resistance between the amorphous and crystalline phases can be used for phase-change random access memory (PCRAM). Reduction of the energy to operate is one of the major challenges in PCRAM technology. One strategy for energy reduction is to increase the resistance of the memory device in the crystalline state of the PCM. Cr2Ge2Te6 (CrGT) shows p-type semiconductor characteristics in both the amorphous and crystalline phases. A CrGT-based memory device shows a contact resistance–dominant behavior, suggesting that the resistance of a CrGT-based memory device can be increased by changing the electrode material. The contact resistivity (ρc) of a CrGT/electrode increases with a decrease in the work function of the electrode material in both amorphous and crystalline phases, as with general p-type semiconductor materials. The highest ρc is observed for a LaB6 electrode. The resistance of the CrGT-based device with a LaB6 electrode (LaB6 device) is three or four orders of magnitude greater than that of a device with a W electrode (W device). The LaB6 device is indicated to require much smaller operation energy than the W device.

Original languageEnglish
Article number2000392
JournalPhysica Status Solidi - Rapid Research Letters
Volume15
Issue number3
DOIs
Publication statusPublished - 2021 Mar

Keywords

  • Cr–Ge–Te
  • contact resistivity
  • inverse resistance change
  • low operation energy
  • phase change memory

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

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