Hardness, yield strength, and dislocation velocity in elemental and compound semiconductors

Ichiro Yonenaga

Research output: Contribution to journalArticlepeer-review

61 Citations (Scopus)


Current knowledge on macroscopic plasticity indications, i.e., hardness and yield strength, and on microscopic indication, i.e., velocity of individual dislocations, in elemental and IV-IV, III-V, and II-VI compound semiconductors including GaN and ZnSe are reported and discussed on their mutual correlations. The Vickers hardness of the semiconductors can provide conventional information on the material plasticity in a wide temperature range up to their melting points over a wide range of size scales in various material forms. Hardness Hv in diamond- and sphalerite-type semiconductors has a universal relationship on their temperature dependence similar to the yield strength τy with a relation Hv = (70-100) τy in the low temperature region. Yield strength obtained by normal tensile or compression tests are expressed by an experimental equation as a function of the strain rate and temperature. The velocities of various types of dislocations measured directly in several semiconductors are described with an empirical equation as a function of the stress and the temperature. Through the analysis of yield strength data in terms of the collective motion of dislocations during the plastic deformation, the dislocation motion, rate-controlling plastic deformation, are deduced. The activation energy for dislocation motion has a linear relation to the band gap energy, depending on the types of semiconductors, elemental, III-V compounds, and II-VI compounds.

Original languageEnglish
Pages (from-to)1979-1985
Number of pages7
JournalMaterials Transactions
Issue number9
Publication statusPublished - 2005 Sep


  • Dislocations
  • Hardness
  • Semiconductors
  • Velocity
  • Wide-band-gap
  • Yield strength

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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