Hard-x-ray phase-difference microscopy with a low-brilliance laboratory x-ray source

Hiroaki Kuwabara, Wataru Yashiro, Sébastien Harasse, Haruo Mizutani, Atsushi Momose

Research output: Contribution to journalArticlepeer-review

25 Citations (Scopus)


We have developed a hard-X-ray phase-imaging microscopy method using a low-brilliance X-ray source. The microscope consists of a sample, a Fresnel zone plate, a transmission grating, and a source grating creating an array of mutually incoherent X-ray sources. The microscope generates an image exhibiting twin features of the sample with opposite signs separated by a distance, which is processed to generate a phase image. The method is quantitative even for non-weak-phase objects that are difficult to be quantitatively examined by the widely used Zernike phase-contrast microscopy, and it has potentially broad applications in the material and biological science fields.

Original languageEnglish
Article number062502
JournalApplied Physics Express
Issue number6
Publication statusPublished - 2011 Jun 1
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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