Hard X-ray nanoimaging method using local diffraction from metal wire

Hidekazu Takano, Shigeki Konishi, Sho Shimomura, Hiroaki Azuma, Yoshiyuki Tsusaka, Yasushi Kagoshima

Research output: Contribution to journalArticle

Abstract

A simple hard X-ray imaging method achieving a high spatial resolution is proposed. Images are obtained by scanning a metal wire through the wave field to be measured and rotating the sample to collect data for back projection calculations; the local diffraction occurring at the edges of the metal wire operates as a narrow line probe. In-line holograms of a test sample were obtained with a spatial resolution of better than 100 nm. The potential high spatial resolution of this method is shown by calculations using diffraction theory.

Original languageEnglish
Article number023108
JournalApplied Physics Letters
Volume104
Issue number2
DOIs
Publication statusPublished - 2014 Jan 13
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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  • Cite this

    Takano, H., Konishi, S., Shimomura, S., Azuma, H., Tsusaka, Y., & Kagoshima, Y. (2014). Hard X-ray nanoimaging method using local diffraction from metal wire. Applied Physics Letters, 104(2), [023108]. https://doi.org/10.1063/1.4861847