Hard X-ray nanofocusing using total-reflection zone plates

Hidekazu Takano; Takuya Tsuji; Atsuyuki Matsumura; Kenji Sakka; Yoshiyuki Tsusaka; Yasushi Kagoshima

doi:10.1063/1.4937533

Hard X-ray nanofocusing using total-reflection zone plates

Hidekazu Takano, Takuya Tsuji, Atsuyuki Matsumura, Kenji Sakka, Yoshiyuki Tsusaka, Yasushi Kagoshima

Institute of Multidisciplinary Research for Advanced Materials (IMRAM) (institute affiliation only)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A total-reflection zone plate (TRZP), which is a reflective grating that generates a line focus of hard X-rays, was developed. Newly designed TRZPs, introducing a laminar grating concept, were fabricated with various zone parameters. The focusing performances with regard to the beam size and the diffraction efficiency were evaluated using synchrotron radiation X-rays of 10 keV energy. Although the beam sizes measured are insufficient in comparison with the ideal value, the maximum diffraction efficiency, measured at 20%, exceeds the limitations of conventional TRZPs based on a binary grating.

Original language	English
Title of host publication	XRM 2014
Subtitle of host publication	Proceedings of the 12th International Conference on X-Ray Microscopy
Editors	Martin D. de Jonge, David J. Paterson, Christopher G. Ryan
Publisher	American Institute of Physics Inc.
ISBN (Electronic)	9780735413436
DOIs	https://doi.org/10.1063/1.4937533
Publication status	Published - 2016 Jan 28
Event	12th International Conference on X-Ray Microscopy, XRM 2014 - Melbourne, Australia Duration: 2014 Oct 26 → 2014 Oct 31

Publication series

Name	AIP Conference Proceedings
Volume	1696
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Other

Other	12th International Conference on X-Ray Microscopy, XRM 2014
Country	Australia
City	Melbourne
Period	14/10/26 → 14/10/31

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

10.1063/1.4937533

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Takano, H., Tsuji, T., Matsumura, A., Sakka, K., Tsusaka, Y., & Kagoshima, Y. (2016). Hard X-ray nanofocusing using total-reflection zone plates. In M. D. de Jonge, D. J. Paterson, & C. G. Ryan (Eds.), XRM 2014: Proceedings of the 12th International Conference on X-Ray Microscopy [020039] (AIP Conference Proceedings; Vol. 1696). American Institute of Physics Inc.. https://doi.org/10.1063/1.4937533

Hard X-ray nanofocusing using total-reflection zone plates. / Takano, Hidekazu; Tsuji, Takuya; Matsumura, Atsuyuki; Sakka, Kenji; Tsusaka, Yoshiyuki; Kagoshima, Yasushi.

XRM 2014: Proceedings of the 12th International Conference on X-Ray Microscopy. ed. / Martin D. de Jonge; David J. Paterson; Christopher G. Ryan. American Institute of Physics Inc., 2016. 020039 (AIP Conference Proceedings; Vol. 1696).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Takano, H, Tsuji, T, Matsumura, A, Sakka, K, Tsusaka, Y & Kagoshima, Y 2016, Hard X-ray nanofocusing using total-reflection zone plates. in MD de Jonge, DJ Paterson & CG Ryan (eds), XRM 2014: Proceedings of the 12th International Conference on X-Ray Microscopy., 020039, AIP Conference Proceedings, vol. 1696, American Institute of Physics Inc., 12th International Conference on X-Ray Microscopy, XRM 2014, Melbourne, Australia, 14/10/26. https://doi.org/10.1063/1.4937533

Takano, Hidekazu ; Tsuji, Takuya ; Matsumura, Atsuyuki ; Sakka, Kenji ; Tsusaka, Yoshiyuki ; Kagoshima, Yasushi. / Hard X-ray nanofocusing using total-reflection zone plates. XRM 2014: Proceedings of the 12th International Conference on X-Ray Microscopy. editor / Martin D. de Jonge ; David J. Paterson ; Christopher G. Ryan. American Institute of Physics Inc., 2016. (AIP Conference Proceedings).

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title = "Hard X-ray nanofocusing using total-reflection zone plates",

abstract = "A total-reflection zone plate (TRZP), which is a reflective grating that generates a line focus of hard X-rays, was developed. Newly designed TRZPs, introducing a laminar grating concept, were fabricated with various zone parameters. The focusing performances with regard to the beam size and the diffraction efficiency were evaluated using synchrotron radiation X-rays of 10 keV energy. Although the beam sizes measured are insufficient in comparison with the ideal value, the maximum diffraction efficiency, measured at 20%, exceeds the limitations of conventional TRZPs based on a binary grating.",

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note = "Publisher Copyright: {\textcopyright} 2016 AIP Publishing LLC. Copyright: Copyright 2016 Elsevier B.V., All rights reserved.; 12th International Conference on X-Ray Microscopy, XRM 2014 ; Conference date: 26-10-2014 Through 31-10-2014",

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N2 - A total-reflection zone plate (TRZP), which is a reflective grating that generates a line focus of hard X-rays, was developed. Newly designed TRZPs, introducing a laminar grating concept, were fabricated with various zone parameters. The focusing performances with regard to the beam size and the diffraction efficiency were evaluated using synchrotron radiation X-rays of 10 keV energy. Although the beam sizes measured are insufficient in comparison with the ideal value, the maximum diffraction efficiency, measured at 20%, exceeds the limitations of conventional TRZPs based on a binary grating.

AB - A total-reflection zone plate (TRZP), which is a reflective grating that generates a line focus of hard X-rays, was developed. Newly designed TRZPs, introducing a laminar grating concept, were fabricated with various zone parameters. The focusing performances with regard to the beam size and the diffraction efficiency were evaluated using synchrotron radiation X-rays of 10 keV energy. Although the beam sizes measured are insufficient in comparison with the ideal value, the maximum diffraction efficiency, measured at 20%, exceeds the limitations of conventional TRZPs based on a binary grating.

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A2 - de Jonge, Martin D.

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ER -

Hard X-ray nanofocusing using total-reflection zone plates

Abstract

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