Hard X-ray nanofocusing using total-reflection zone plates

Hidekazu Takano, Takuya Tsuji, Atsuyuki Matsumura, Kenji Sakka, Yoshiyuki Tsusaka, Yasushi Kagoshima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A total-reflection zone plate (TRZP), which is a reflective grating that generates a line focus of hard X-rays, was developed. Newly designed TRZPs, introducing a laminar grating concept, were fabricated with various zone parameters. The focusing performances with regard to the beam size and the diffraction efficiency were evaluated using synchrotron radiation X-rays of 10 keV energy. Although the beam sizes measured are insufficient in comparison with the ideal value, the maximum diffraction efficiency, measured at 20%, exceeds the limitations of conventional TRZPs based on a binary grating.

Original languageEnglish
Title of host publicationXRM 2014
Subtitle of host publicationProceedings of the 12th International Conference on X-Ray Microscopy
EditorsMartin D. de Jonge, David J. Paterson, Christopher G. Ryan
PublisherAmerican Institute of Physics Inc.
ISBN (Electronic)9780735413436
DOIs
Publication statusPublished - 2016 Jan 28
Event12th International Conference on X-Ray Microscopy, XRM 2014 - Melbourne, Australia
Duration: 2014 Oct 262014 Oct 31

Publication series

NameAIP Conference Proceedings
Volume1696
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other12th International Conference on X-Ray Microscopy, XRM 2014
CountryAustralia
CityMelbourne
Period14/10/2614/10/31

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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