Hard X-ray nano-interferometer and its application to high-spatial- resolution phase tomography

Takahisa Koyama, Takuya Tsuji, Keisuke Yoshida, Hidekazu Takano, Yoshiyuki Tsusaka, Yasushi Kagoshima

Research output: Contribution to journalArticlepeer-review

31 Citations (Scopus)


A hard X-ray nano-interferometer using two types of zone plate has been developed. One is an ordinary zone plate for a microscope objective, and the other is a newly designed zone plate called an "annular zone plate" for configuring reference waves. We have succeeded in producing interference fringes with variable periods up to a fringeless pattern. The phase-shift distribution of polystyrene microparticles could be imaged clearly with a spatial resolution of 60 nm and a phase sensitivity of λ/40 at a photon energy of 8keV. Furthermore, this interferometer was applied to phase tomography for high-spatial-resolution three-dimensional observation.

Original languageEnglish
Pages (from-to)L1159-L1161
JournalJapanese Journal of Applied Physics, Part 2: Letters
Issue number42-45
Publication statusPublished - 2006 Nov 10
Externally publishedYes


  • Fringe scanning method
  • Phase contrast
  • Phase retrieval
  • Phase tomography
  • Synchrotron radiation
  • X-ray interferometer
  • X-ray microscopy
  • Zone plate

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)


Dive into the research topics of 'Hard X-ray nano-interferometer and its application to high-spatial- resolution phase tomography'. Together they form a unique fingerprint.

Cite this