Hard and soft x-ray photoemission spectroscopy study of the new Kondo system SmO thin film

Shoya Sakamoto, Kenichi Kaminaga, Daichi Oka, Ryu Yukawa, Masafumi Horio, Yuichi Yokoyama, Kohei Yamamoto, Kou Takubo, Yosuke Nonaka, Keisuke Koshiishi, Masaki Kobayashi, Arata Tanaka, Akira Yasui, Eiji Ikenaga, Hiroki Wadati, Hiroshi Kumigashira, Tomoteru Fukumura, Atsushi Fujimori

Research output: Contribution to journalArticlepeer-review

Abstract

SmO thin film is a new Kondo system showing a resistivity upturn around 10 K and was theoretically proposed to have a topologically nontrivial band structure. We perform hard x-ray and soft x-ray photoemission spectroscopy to elucidate the electronic structure of SmO. From the Sm 3d core-level spectra, we estimate the valence of Sm to be ∼2.96, proving that the Sm has a mixed valence. The valence-band photoemission spectra exhibit a clear Fermi edge originating from the Sm 5d-derived band. The present finding is consistent with the theory suggesting a possible topological state in SmO and show that rare-earth monoxides or their heterostructures can be a new playground for the interplay of strong electron correlation and spin-orbit coupling.

Original languageEnglish
Article number095001
JournalPhysical Review Materials
Volume4
Issue number9
DOIs
Publication statusPublished - 2020 Sep

ASJC Scopus subject areas

  • Materials Science(all)
  • Physics and Astronomy (miscellaneous)

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