Abstract
We have investigated the bulk and surface electronic structures of Sm 4As3 by using hard and soft X-ray photoemission spectroscopies (PESs). The valence band spectral shape changes much with photon energies (hν s) due to the variation of both photoionization cross sections and bulk sensitivity. PES with the wide range of hν s between 220 and 2450 eV demonstrates that the valence of the Sm ions is definitely trivalent in the bulk and divalent at the surface.
Original language | English |
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Pages (from-to) | 617-619 |
Number of pages | 3 |
Journal | Journal of Electron Spectroscopy and Related Phenomena |
Volume | 144-147 |
DOIs | |
Publication status | Published - 2005 Jun |
Externally published | Yes |
Keywords
- Bulk sensitive
- Hard X-ray
- Photoemission
- SmAs
- Soft X-ray
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Radiation
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Spectroscopy
- Physical and Theoretical Chemistry