Hard and soft X-ray photoemission spectroscopies of ferromagnetic Sm 4As3

A. Yamasaki; A. Sekiyama; M. Tsunekawa; S. Imada; A. Ochiai; C. Dallera; L. Braicovich; T. L. Lee; S. Suga

doi:10.1016/j.elspec.2005.01.017

Hard and soft X-ray photoemission spectroscopies of ferromagnetic Sm ₄As₃

A. Yamasaki, A. Sekiyama, M. Tsunekawa, S. Imada, A. Ochiai, C. Dallera, L. Braicovich, T. L. Lee, S. Suga

Research output: Contribution to journal › Article › peer-review

Abstract

We have investigated the bulk and surface electronic structures of Sm ₄As₃ by using hard and soft X-ray photoemission spectroscopies (PESs). The valence band spectral shape changes much with photon energies (hν s) due to the variation of both photoionization cross sections and bulk sensitivity. PES with the wide range of hν s between 220 and 2450 eV demonstrates that the valence of the Sm ions is definitely trivalent in the bulk and divalent at the surface.

Original language	English
Pages (from-to)	617-619
Number of pages	3
Journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	144-147
DOIs	https://doi.org/10.1016/j.elspec.2005.01.017
Publication status	Published - 2005 Jun
Externally published	Yes

Keywords

Bulk sensitive
Hard X-ray
Photoemission
SmAs
Soft X-ray

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Radiation
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Spectroscopy
Physical and Theoretical Chemistry

Access to Document

10.1016/j.elspec.2005.01.017

Cite this

@article{005ed91406ed48678c78beb47539b5e9,

title = "Hard and soft X-ray photoemission spectroscopies of ferromagnetic Sm 4As3",

abstract = "We have investigated the bulk and surface electronic structures of Sm 4As3 by using hard and soft X-ray photoemission spectroscopies (PESs). The valence band spectral shape changes much with photon energies (hν s) due to the variation of both photoionization cross sections and bulk sensitivity. PES with the wide range of hν s between 220 and 2450 eV demonstrates that the valence of the Sm ions is definitely trivalent in the bulk and divalent at the surface.",

keywords = "Bulk sensitive, Hard X-ray, Photoemission, SmAs, Soft X-ray",

author = "A. Yamasaki and A. Sekiyama and M. Tsunekawa and S. Imada and A. Ochiai and C. Dallera and L. Braicovich and Lee, {T. L.} and S. Suga",

note = "Funding Information: The research was performed at SPring-8 (Proposal No. 2003A0593-NS1-np) and ESRF (Proposal No. HE1422) under the support of a Grant-in-Aid for COE Research (No. 10CE2004) of the Ministry of Education, Culture, Sports, Science, and Technology, Japan.",

year = "2005",

month = jun,

doi = "10.1016/j.elspec.2005.01.017",

language = "English",

volume = "144-147",

pages = "617--619",

journal = "Journal of Electron Spectroscopy and Related Phenomena",

issn = "0368-2048",

publisher = "Elsevier",

}

TY - JOUR

T1 - Hard and soft X-ray photoemission spectroscopies of ferromagnetic Sm 4As3

AU - Yamasaki, A.

AU - Sekiyama, A.

AU - Tsunekawa, M.

AU - Imada, S.

AU - Ochiai, A.

AU - Dallera, C.

AU - Braicovich, L.

AU - Lee, T. L.

AU - Suga, S.

N1 - Funding Information: The research was performed at SPring-8 (Proposal No. 2003A0593-NS1-np) and ESRF (Proposal No. HE1422) under the support of a Grant-in-Aid for COE Research (No. 10CE2004) of the Ministry of Education, Culture, Sports, Science, and Technology, Japan.

PY - 2005/6

Y1 - 2005/6

N2 - We have investigated the bulk and surface electronic structures of Sm 4As3 by using hard and soft X-ray photoemission spectroscopies (PESs). The valence band spectral shape changes much with photon energies (hν s) due to the variation of both photoionization cross sections and bulk sensitivity. PES with the wide range of hν s between 220 and 2450 eV demonstrates that the valence of the Sm ions is definitely trivalent in the bulk and divalent at the surface.

AB - We have investigated the bulk and surface electronic structures of Sm 4As3 by using hard and soft X-ray photoemission spectroscopies (PESs). The valence band spectral shape changes much with photon energies (hν s) due to the variation of both photoionization cross sections and bulk sensitivity. PES with the wide range of hν s between 220 and 2450 eV demonstrates that the valence of the Sm ions is definitely trivalent in the bulk and divalent at the surface.

KW - Bulk sensitive

KW - Hard X-ray

KW - Photoemission

KW - SmAs

KW - Soft X-ray

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DO - 10.1016/j.elspec.2005.01.017

M3 - Article

AN - SCOPUS:17444428936

VL - 144-147

SP - 617

EP - 619

JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

SN - 0368-2048

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