Growth of the Al-Pd-Re and Al-Cu-Fe single quasicrystals

J. Q. Guo, Taku J Sato, E. Abe, H. Takakura, Ampo Sai

Research output: Contribution to journalArticlepeer-review

Abstract

Partial phase diagrams involving Al-Pd-Re and Al-Cu-Fe icosahedral quasicrystals were constructed to grow their single quasicrystals. On the basis of the phase diagrams, Al-Pd-Re and Al-Cu-Fe single icosahedral quasicrystals were grown by a slow cooling method. Electrical resistivity of the Al-Pd-Re single quasicrystals, ρ, was measured to be 2000∼4000 μΩcm at 300K and 3000∼6000 μΩcm at 2K, revealing negative temperature dependence with a value of ρ4.2K′ ρ300K smaller than 2.

Original languageEnglish
Pages (from-to)253-256
Number of pages4
JournalFerroelectrics
Volume250
Issue number1-4
DOIs
Publication statusPublished - 2001 Jan 1
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Growth of the Al-Pd-Re and Al-Cu-Fe single quasicrystals'. Together they form a unique fingerprint.

Cite this