Abstract
Selenization growth of purely single-phase, polycrystalline CuIn1 - xGaxSe2 (0 ≤ x ≤ 1) alloy films was demonstrated using a less-hazardous metalorganic selenide, diethylselenide [(C2H5)2Se: DESe], without additional thermal annealing. Approximately 2.0-μm-thick films of the alloys exhibited X-ray diffraction peaks originating exclusively from the chalcopyrite structure. Low temperature photoluminescence spectra of the alloy films were dominated by a couple of characteristic donor-acceptor pair emissions that are particular to the state-of-the-art CuInGaSe2 photo-absorbing layers.
Original language | English |
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Pages (from-to) | 5867-5870 |
Number of pages | 4 |
Journal | Thin Solid Films |
Volume | 515 |
Issue number | 15 SPEC. ISS. |
DOIs | |
Publication status | Published - 2007 May 31 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry