Growth of L10-FeNi thin films on Cu(001) single crystal substrates using oxygen and gold surfactants

Takayuki Kojima; Masaki Mizuguchi; Koki Takanashi

doi:10.1016/j.tsf.2016.02.040

Growth of L1₀-FeNi thin films on Cu(001) single crystal substrates using oxygen and gold surfactants

Takayuki Kojima, Masaki Mizuguchi, Koki Takanashi

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

We alternately deposited Ni and Fe monatomic layers on Cu(001) single crystal substrates and also performed surfactant-mediated growth. FeNi films exhibited a large uniaxial magnetic anisotropy (K_u) of over 0.1 MJ/m³ by using an oxygen or a gold surfactant, although K_u was almost zero without surfactants. Reflection high-energy electron diffraction and atomic force microscopy indicated surfactant effects of oxygen and gold. Synchrotron X-ray diffraction indicated a formation of an L1₀-type ordered FeNi phase having a large K_u. We have considered that the surfactants enhanced layer-by-layer growth leading to the L1₀-ordering by changing a diffusion scenario of Fe and Ni atoms.

Original language	English
Pages (from-to)	348-352
Number of pages	5
Journal	Thin Solid Films
Volume	603
DOIs	https://doi.org/10.1016/j.tsf.2016.02.040
Publication status	Published - 2016 Mar 31

Keywords

L1-FeNi
Magnetic anisotropy
Noble metal free
Rare-earth free
Surfactant

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

Access to Document

10.1016/j.tsf.2016.02.040

Cite this

@article{84823d1858684f67b75deccd4c63e082,

title = "Growth of L10-FeNi thin films on Cu(001) single crystal substrates using oxygen and gold surfactants",

abstract = "We alternately deposited Ni and Fe monatomic layers on Cu(001) single crystal substrates and also performed surfactant-mediated growth. FeNi films exhibited a large uniaxial magnetic anisotropy (Ku) of over 0.1 MJ/m3 by using an oxygen or a gold surfactant, although Ku was almost zero without surfactants. Reflection high-energy electron diffraction and atomic force microscopy indicated surfactant effects of oxygen and gold. Synchrotron X-ray diffraction indicated a formation of an L10-type ordered FeNi phase having a large Ku. We have considered that the surfactants enhanced layer-by-layer growth leading to the L10-ordering by changing a diffusion scenario of Fe and Ni atoms.",

keywords = "L1-FeNi, Magnetic anisotropy, Noble metal free, Rare-earth free, Surfactant",

author = "Takayuki Kojima and Masaki Mizuguchi and Koki Takanashi",

note = "Funding Information: We are grateful to Dr. Koganezawa of Japan Synchrotron Radiation Research Institute (JASRI/SPring-8) for his support regarding XRD measurements using synchrotron radiation. The synchrotron XRD measurements were performed at BL46XU at SPring-8 with the approval of JASRI (Proposal Nos. 2012B1667, 2013A1637, 2013A1832, 2013B1590). This work was partially supported by Grant-in-Aids for Scientific Research (S) ( 25220910 ) and for JSPS Fellows ( 23•8329 ), and by the Elements Strategy Initiative Project under the auspice of MEXT. Publisher Copyright: {\textcopyright} 2016 Elsevier B.V. All rights reserved.",

year = "2016",

month = mar,

day = "31",

doi = "10.1016/j.tsf.2016.02.040",

language = "English",

volume = "603",

pages = "348--352",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

}

TY - JOUR

T1 - Growth of L10-FeNi thin films on Cu(001) single crystal substrates using oxygen and gold surfactants

AU - Kojima, Takayuki

AU - Mizuguchi, Masaki

AU - Takanashi, Koki

N1 - Funding Information: We are grateful to Dr. Koganezawa of Japan Synchrotron Radiation Research Institute (JASRI/SPring-8) for his support regarding XRD measurements using synchrotron radiation. The synchrotron XRD measurements were performed at BL46XU at SPring-8 with the approval of JASRI (Proposal Nos. 2012B1667, 2013A1637, 2013A1832, 2013B1590). This work was partially supported by Grant-in-Aids for Scientific Research (S) ( 25220910 ) and for JSPS Fellows ( 23•8329 ), and by the Elements Strategy Initiative Project under the auspice of MEXT. Publisher Copyright: © 2016 Elsevier B.V. All rights reserved.

PY - 2016/3/31

Y1 - 2016/3/31

N2 - We alternately deposited Ni and Fe monatomic layers on Cu(001) single crystal substrates and also performed surfactant-mediated growth. FeNi films exhibited a large uniaxial magnetic anisotropy (Ku) of over 0.1 MJ/m3 by using an oxygen or a gold surfactant, although Ku was almost zero without surfactants. Reflection high-energy electron diffraction and atomic force microscopy indicated surfactant effects of oxygen and gold. Synchrotron X-ray diffraction indicated a formation of an L10-type ordered FeNi phase having a large Ku. We have considered that the surfactants enhanced layer-by-layer growth leading to the L10-ordering by changing a diffusion scenario of Fe and Ni atoms.

AB - We alternately deposited Ni and Fe monatomic layers on Cu(001) single crystal substrates and also performed surfactant-mediated growth. FeNi films exhibited a large uniaxial magnetic anisotropy (Ku) of over 0.1 MJ/m3 by using an oxygen or a gold surfactant, although Ku was almost zero without surfactants. Reflection high-energy electron diffraction and atomic force microscopy indicated surfactant effects of oxygen and gold. Synchrotron X-ray diffraction indicated a formation of an L10-type ordered FeNi phase having a large Ku. We have considered that the surfactants enhanced layer-by-layer growth leading to the L10-ordering by changing a diffusion scenario of Fe and Ni atoms.

KW - L1-FeNi

KW - Magnetic anisotropy

KW - Noble metal free

KW - Rare-earth free

KW - Surfactant

UR - http://www.scopus.com/inward/record.url?scp=84960885718&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84960885718&partnerID=8YFLogxK

U2 - 10.1016/j.tsf.2016.02.040

DO - 10.1016/j.tsf.2016.02.040

M3 - Article

AN - SCOPUS:84960885718

VL - 603

SP - 348

EP - 352

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

ER -